GB24_Instrumentation for High Frequency electronics


The Instrumentation Circuits area of the PLATINOM platform in the XLIM laboratory provides researchers, academics and industry with access to cutting-edge linear and non-linear metrology measurement tools.

This technical platform comprises a set of equipment and benches for measurements of microwave and sub-millimetric devices allowing the characterization of components, circuits and materials dedicated to applications in the field of telecommunications, space, defence and security.

All these equipments constitute a fundamental element in the research work developed within the various axes and teams of the XLIM Institute.

Damien PASSERIEUX

Manager

+33 5 87 50 68 39

GB24_Linear metrology

Linear metrology Transfer function measurement benches (S parameters). These benches make it possible to characterize components, circuits and systems in the radio frequency domain, from a few tens of MHz to a few hundred GHz. Features: Frequency bands: 10 MHz – 330 GHz (split into different [...]

GB24_Non linear metrology

Nonlinear metrology These measurement benches allow to characterize active devices in power in CW mode or modulated signals and in frequency or time domain. Frequency/time measurement benches: 1 GHz – 40 GHz CW Load-Pull and 1 GHz – 50 GHz Modulated signals (EVM, ACPR, NPR) Features: Frequency [...]

GB24_Material characterizations

Material characterization Material characterization benches up to 330 GHz These benches allow materials from a few hundred MHz to 330 GHz to be characterized and to obtain the dielectric permittivities ɛ and dielectric loss tangents tgδ. Characteristics: Frequency bands: 2 GHz – 330 GHz   [...]

GB24_Fabrication and test components

Testing and assembly of components Wire bonding This type of technological realization consists in connecting two points of a device by thermocompression with a gold wire diameter of the order of a few tens micrometers by adjusting temperature levels, force and pressure depending on the [...]

Previous Next

Instruments and characterization benches available

Made up of a Vector Network Analyzer Keysight PNAX 4 ports 67GHz, 2 millimeters wave heads Olesson Tx/Rx and of a test fixture Swissto12.

On wafer RF devices measurements (until 4 ports): Vector Network Analyzer Keysight PNAX 4 ports 67GHz, manual RF probe station MPI TS200-SE and RF cables and RF infinity probes (FormFactor).

Vector Network Analyzer Keysight PNAX 4 ports 67GHz, millimeter wave heads Tx/Rx Olesson (x2), RF manual probe station PM8 FormFactor, and RF cables and RF infinity probes (FormFactor).

On-wafer devices characterization (until 4 RF ports and 4 DC supply). This bench is made of a Vector Network Analyzer Keysight PNAX 4 ports 67GHz, a manual RF probe station MPI TS200-SE, DC supply in rack Keysight N6701C.

Material characterization (110 -170 GHz)

Multiports S parameter characterization

On-wafer devices characterization (S parameters 110-170GHz)

Multiports S parameter characterization bench

Measurements in millimeter wave domain (70GHz-110Ghz), Vector Network Analyzer Keysight PNAX 4 ports 67GHz, millimeter wave heads Tx/Rx VDI (x2), manual RF probe station MPI TS200-SE.

Measurements in millimeter wave domain (70GHz-110Ghz), Vector Network Analyzer Keysight PNAX 4 ports 67GHz, millimeter wave heads Tx/Rx VDI (x2), RF manual probe station PM8 FormFactor.

Vector Network Analyzer Keysight PNAX 4 ports 67GHz, Manual Rf probe station Cascade Microtech Summit9000, DC supply in rack Keysight N6701C, RF cables and RF infinity probes (FormFactor).

Made of BILT AMCAD with Gate and Drain probe, thermal RF probe station Cascade Microtech MPS150, RF cables, Bias Tee from Agilent and RF probes from FormFactor.

On-wafer devices characterization (S parameters)

On-wafer devices characterization (S parameters)

Low Noise amplifier characterization (until 50GHz)

 I(Current) / V(Voltage) devices characterization

Non linear measurement devices as transistors (transcient regime). This  bench is made of a pulse generator Agilent, a DC supply Agilent and a thermal RF probe station Cascade Microtech MPS150.

This bench is made of Thermoreflectance equipment Microsanj NT-110

IDLTS bench

Thermoreflectance bench

Site de réservation

Services available - contact us

Linear metrology:

– [S] Parameter measurements 10 MHz – 330 GHz

 – Noise Factor (NF 50 ohms + parameters [S]) 10 MHz – 50 GHz

Non-linear metrology:

– Frequency/time measurements CW power Load-Pull 1 GHz – 40 GHz (gain, efficiency, harmonics, IMD)

– Frequency/time measurements in modulated signals power (EVM, ACPR, NPR) 1 GHz – 50 GHz

 – Impulsive IV Measurements

 – IDLTS Measurements

 – Thermoreflectance measurements

Material characterization:

– Material characterization up to 330 GHz

Testing and assembly of components:

 – Wire Bonding

Ressources
Videos, virtual tour, publications

– Design and Additive Microfabrication of a Two-Pole 287-GHz Waveguide Bandpass Filter IEEE Microwave and Wireless Components Letters, 2020, 30 (1), pp.20-22. https://doi.org/10.1109/LMWC.2019.2955595

– Non-Linear Simulation by Harmonic Balance Techniques of Load Modulated Power Amplifier Driven by Random Modulated Signals, Electronics, 2024, 13 (5), pp.947. https://doi.org/10.3390/electronics13050947

Cliquer sur l’image pour lancer la visite virtuelle du domaine Instrumentation Circuits