GB24_Linear metrology
Linear metrology
Transfer function measurement benches (S parameters).
These benches make it possible to characterize components, circuits and systems in the radio frequency domain, from a few tens of MHz to a few hundred GHz.
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Features:Frequency bands: 10 MHz – 330 GHz (split into different bands) Connectics: coaxial, waveguide, on-wafer Polarizations: 200 V – 0.4 A between 10 MHz and 40 GHz 100 V – 0.4 A between 10 MHz and 70 GHz 50V – 0.5 A between 70 GHz and 330 GHz |
Feasible measures:Measured parameters: S parameters Measured devices: passive devices (microwave filters, RF MEMS,…) and active devices (transistors, LNA, amplifiers,…) |
Noise Measurement Bench (NF 50 ohms + S parameters) 10 MHz – 50 GHz
This bench allows to characterize both the [S] parameters in the frequency range as well as the noise factor (Noise Figure) which corresponds to the degradation of the signal-to-noise ratio between the output and the input of the device under test, adapted 50 ohms.
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Features:Frequency band: 10 MHz – 50 GHz Connectics: coaxial, waveguide, on-wafer |
Feasible measures:Measured parameters: S and Noise Figure (NF 50 ohms) Measured devices: active devices (LNA (Low noise amplifier) adapted 50 ohms) |
