GB24_Non linear metrology
Nonlinear metrology
These measurement benches allow to characterize active devices in power in CW mode or modulated signals and in frequency or time domain.
Frequency/time measurement benches: 1 GHz – 40 GHz CW Load-Pull and 1 GHz – 50 GHz Modulated signals (EVM, ACPR, NPR)
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Features:Frequency bands: 1 GHz – 40 GHz (time domain limited to 26 GHz) Power ranges: 10 Watts up to 50 Watts depending on frequency range Connectics: coaxial, waveguide, on-wafer |
Feasible measures:Measured parameters: – in CW (output power, gain, efficiency, IMD), – in modulated signals (output power, gain, efficiency, IMD, EVM, ACPR, NPR, …) Measured devices: active components, circuits and sub-systems (diodes, transistors, amplifiers,…) |
Thermoreflectance measurement bench
Microwave devices are made of one or more layers of materials, but the reflectivity of a material changes with temperature. Thus, with this measurement bench, it is possible to characterize the coefficient of thermoreflectance and thermal resistance.
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Features:4MP Camera – 4 sources 365 nm, 470 nm, 530nm, 780 nm Spatial resolution 0.29 um Time resolution 50 ns Temperature resolution (Au: 0.5°C (5 min)) |
Feasible measures:Coefficient of thermoreflectance Cth Thermal resistance Rth (°C/W) |
