Portrait of Alexandre Boulle

Alexandre Boulle

CNRS Research Director

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Publications

140 peer-reviewed articles and book chapters, 2001–2026

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2026

  1. M.N. Tran, D.M. Nguyen, M.K. Ahounou, E. de la Torre Miranda, M. Alzate Banguero, D. Troadec, C. Coinon, A. Addad, K. Ben Tayeb, A. Boulle, P. Diener, D. Mele, L. Thomas, X. Wallart, L. Aigouy, A. Zimmers, A. Crunteanu, V. Ordomsky, B. Grandidier

    Exploiting the insulator–metal transition of VO2 in photocatalytic methane conversion

    Nature Energy 11, 613–622 · doi:10.1038/s41560-026-02013-w

  2. A. Souesme, R. Guinebretière, O. Castelnau, A. Boulle

    High-throughput determination of crystallite size and microstrain from x-ray diffraction data with deep neural networks

    Machine Learning: Science and Technology 7, Art. 25054 · doi:10.1088/2632-2153/ae55f9

2025

  1. E.-N. Sirjita, A. Boulle, J.-C. Orlianges, R. Mayet, A. Debelle, L. Thomé, M. Colas, J. Cornette, A. Crunteanu

    Electrically Activated W-Doped VO2 Films for Reliable, Large-Area, Broadband THz Wave Modulators

    ACS Applied Materials and Interfaces 17, 24564–24577 · doi:10.1021/acsami.5c00777

  2. G. Velişa, E. Zarkadoula, D. Iancu, M.D. Mihai, A. Boulle, Y. Tong, D. Chen, Y. Zhang, W.J. Weber

    Revealing a Pathway for Low-Temperature Recrystallization in Germanium

    Advanced Science 12, Art. e07630 · doi:10.1002/advs.202507630

2024

  1. G. Gutierrez, A. Boulle, D. Menut, A. Georgesco, C. Onofri, J.-L. Béchade, A. Debelle

    Coupled effects of electronic and nuclear energy deposition in UO2 crystals: A high-resolution XRD study carried out at the MARS beamline of the SOLEIL synchrotron facility

    Nuclear Instruments and Methods in Physics Research B 557, Art. 165491 · doi:10.1016/j.nimb.2024.165491

  2. J.-C. Orlianges, O. Allegret, E.-N. Sirjita, A. Masson, A. Boulle, V. Théry, S. Tardif, J.S. Micha, A. Crunteanu

    Electrical activation of insulator-to-metal transition in vanadium dioxide single-crystal nanobeam and their high-frequency switching performances

    Journal of Applied Physics 136, Art. 64502 · doi:10.1063/5.0221152

  3. A. Chakravorty, A. Boulle, A. Debelle, G. Manna, P. Saha, D. Kanjilal, D. Kabiraj

    Synchrotron-based x-ray diffraction analysis of energetic ion-induced strain in GaAs and 4H-SiC

    Journal of Applied Physics 136, Art. 35902 · doi:10.1063/5.0205284

2023

  1. A. Boulle, A. Debelle

    Convolutional neural network analysis of x-ray diffraction data: strain profile retrieval in ion beam modified materials

    Machine Learning: Science and Technology 4, Art. 15002 · doi:10.1088/2632-2153/acab4c

  2. N. Ranger, C.-D. Constantinescu, R. Lucas-Roper, A. Boulle, N. Glandut

    Structural and electrochemical properties of high quality epitaxial titanium carbide thin films grown by pulsed laser deposition on MgO (111) and Al2O3 (001) substrates

    Thin Solid Films 782, Art. 140007 · doi:10.1016/j.tsf.2023.140007

2022

  1. A. Ionut Bercea, C. Champeaux, A. Boulle, C. Daniel Constantinescu, J. Cornette, M. Colas, S. Vedraine, F. Dumas-Bouchiat

    Adaptive gold/vanadium dioxide periodic arrays for infrared optical modulation

    Applied Surface Science 585, Art. 152592 · doi:10.1016/j.apsusc.2022.152592

  2. M. El-Bakouri El-Haddaji, J.-P. Crocombette, A. Boulle, A. Chartier, A. Debelle

    Basic study of the relaxation volume of crystalline defects in bcc iron

    Computational Materials Science 215, Art. 111816 · doi:10.1016/j.commatsci.2022.111816

  3. A. Boulle, A. Chartier, A. Debelle, X. Jin, J.-P. Crocombette

    Computational diffraction reveals long-range strains, distortions and disorder in molecular dynamics simulations of irradiated single crystals

    Journal of Applied Crystallography 55, 296–309 · doi:10.1107/S1600576722001406

  4. A. Debelle, G. Gutierrez, A. Boulle, I. Monnet, L. Thomé

    Effect of energy deposition on the disordering kinetics in dual-ion beam irradiated single-crystalline GaAs

    Journal of Applied Physics 132, Art. 85905 · doi:10.1063/5.0096764

  5. A. Chakravorty, A. Boulle, A. Debelle, I. Monnet, G. Manna, P. Saha, M.K. Mukhopadhyay, D. Kabiraj

    Monitoring of the recovery of ion-damaged 4H-SiC with in situ synchrotron X-ray diffraction as a tool for strain-engineering

    Journal of Materials Science 57, 20309–20319 · doi:10.1007/s10853-022-07876-4

  6. E.-N. Sirjita, A. Boulle, J.-C. Orlianges, R. Mayet, A. Crunteanu

    Structural and electrical properties of high-performance vanadium dioxide thin layers obtained by reactive magnetron sputtering

    Thin Solid Films 759, Art. 139461 · doi:10.1016/j.tsf.2022.139461

2021

  1. X. Jin, A. Boulle, J. Bourcoit, A. Debelle

    Comparison of neutron and ion irradiation induced lattice parameter changes in Ni and MgO single crystals

    Journal of Nuclear Materials 557, Art. 153308 · doi:10.1016/j.jnucmat.2021.153308

  2. A. Debelle, G. Gutierrez, A. Boulle, F. Garrido, O. Najjar, E. Olebunne, F. Pallier, C. Cabet, L. Thomé

    Disordering kinetics in monocrystalline and epitaxial Si upon energy deposition induced by dual-beam ion irradiation

    Applied Physics A 127, Art. 771 · doi:10.1007/s00339-021-04890-2

  3. P.C.M. Fossati, A. Chartier, A. Boulle

    Structural Aspects of the Superionic Transition in AX2 Compounds With the Fluorite Structure

    Frontiers in Chemistry 9, Art. 723507 · doi:10.3389/fchem.2021.723507

2020

  1. X. Jin, A. Boulle, A. Chartier, J.-P. Crocombette, A. Debelle

    Analysis of strain and disordering kinetics based on combined RBS-channeling and X-ray diffraction atomic-scale modelling

    Acta Materialia 201, 63–71 · doi:10.1016/j.actamat.2020.09.076

  2. M. Muňoz, M. Cerbelaud, A. Videcoq, H. Saad, A. Boulle, S. Meille, S. Deville, F. Rossignol

    Nacre-like alumina composites based on heteroaggregation

    Journal of the European Ceramic Society 40, 5773–5778 · doi:10.1016/j.jeurceramsoc.2020.06.049

  3. A. Boulle, V. Mergnac

    RaDMaX online: a web-based program for the determination of strain and damage profiles in irradiated crystals using X-ray diffraction

    Journal of Applied Crystallography 53, 587–593 · doi:10.1107/S1600576720002514

  4. F.X. Zhang, H. Xue, J.K. Keum, A. Boulle, Y. Zhang, W.J. Weber

    Symmetry degeneration and room temperature ferroelectricity in ion-irradiated SrTiO3

    Journal of Physics: Condensed Matter 32, Art. 355405 · doi:10.1088/1361-648X/ab8ec7

  5. L. Trupina, L. Nedelcu, M.G. Banciu, A. Crunteanu, L. Huitema, C. Constantinescu, A. Boulle

    Texture and interface characterization of iridium thin films grown on MgO substrates with different orientations

    Journal of Materials Science 55, 1753–1764 · doi:10.1007/s10853-019-04004-7

2019

  1. L.B. Bayu Aji, E. Stavrou, J.B. Wallace, A. Boulle, A. Debelle, S.O. Kucheyev

    Comparative study of radiation defect dynamics in 3C-SiC by X-ray diffraction, Raman scattering, and ion channeling

    Applied Physics A 125, Art. 28 · doi:10.1007/s00339-018-2325-7

  2. S. Creutzburg, E. Schmidt, P. Kutza, R. Loetzsch, I. Uschmann, A. Undisz, M. Rettenmayr, F. Gala, G. Zollo, A. Boulle, A. Debelle, E. Wendler

    Defects and mechanical properties in weakly damaged Si ion implanted GaAs

    Physical Review B 99, Art. 245205 · doi:10.1103/PhysRevB.99.245205

  3. C. Jiang, A. Declémy, M.-F. Beaufort, A. Boulle, J.-F. Barbot

    Effect of temperature on Xe implantation-induced damage in 4H-SiC

    Journal of Physics: Conference Series 1190, Art. 12015 · doi:10.1088/1742-6596/1190/1/012015

  4. A. Boulle, J. Kieffer

    High-performance Python for crystallographic computing

    Journal of Applied Crystallography 52, 882–897 · doi:10.1107/S1600576719008471

  5. A. Boulle, A. Chartier, J.-P. Crocombette, T. Jourdan, S. Pellegrino, A. Debelle

    Strain and damage build-up in irradiated crystals: Coupling X-ray diffraction with numerical simulations

    Nuclear Instruments and Methods in Physics Research B 458, 143–150 · doi:10.1016/j.nimb.2018.11.048

  6. F.X. Zhang, Y. Tong, H. Xue, J.K. Keum, Y. Zhang, A. Boulle, A. Debelle, W.J. Weber

    Strain engineering 4H-SiC with ion beams

    Applied Physics Letters 114, Art. 221904 · doi:10.1063/1.5109226

  7. L. Guironnet, P.-M. Geffroy, N. Tessier-Doyen, A. Boulle, N. Richet, T. Chartier

    The surface roughness effect on electrochemical properties of La0.5Sr0.5Fe0.7Ga0.3O3-Δ perovskite for oxygen transport membranes

    Journal of Membrane Science 588, Art. 117199 · doi:10.1016/j.memsci.2019.117199

2018

  1. A. Debelle, J.-P. Crocombette, A. Boulle, E. Martinez, B.P. Uberuaga, D. Bachiller-Perea, Y. Haddad, F. Garrido, L. Thomé, M. Béhar

    How relative defect migration energies drive contrasting temperature-dependent microstructural evolution in irradiated ceramics

    Physical Review Materials 2, Art. 83605 · doi:10.1103/PhysRevMaterials.2.083605

  2. A. Debelle, J.-P. Crocombette, A. Boulle, A. Chartier, T. Jourdan, S. Pellegrino, D. Bachiller-Perea, D. Carpentier, J. Channagiri, T.-H. Nguyen, F. Garrido, L. Thomé

    Lattice strain in irradiated materials unveils a prevalent defect evolution mechanism

    Physical Review Materials 2, Art. 13604 · doi:10.1103/PhysRevMaterials.2.013604

  3. Petrișor T., Jr., A. Meledin, A. Boulle, R.B. Moș, M.S. Gabor, L. Ciontea, T. Petrișor

    Ordered misfit dislocations in epitaxial Gd doped CeO 2 thin films deposited on (001)YSZ single crystal substrates

    Applied Surface Science 433, 668–673 · doi:10.1016/j.apsusc.2017.09.202

2017

  1. V. Théry, A. Boulle, A. Crunteanu, J.C. Orlianges

    Combined strain and composition-induced effects in the metal-insulator transition of epitaxial VO2 films

    Applied Physics Letters 111, Art. 251902 · doi:10.1063/1.5010147

  2. A. Boulle

    DxTools: Processing large data files recorded with the Bruker D8 diffractometer

    Journal of Applied Crystallography 50, 967–974 · doi:10.1107/S1600576717005192

  3. V. Théry, A. Boulle, A. Crunteanu, J.C. Orlianges, A. Beaumont, R. Mayet, A. Mennai, F. Cosset, A. Bessaudou, M. Fabert

    Structural and electrical properties of large area epitaxial VO2 films grown by electron beam evaporation

    Journal of Applied Physics 121, Art. 55303 · doi:10.1063/1.4975117

  4. A. Boulle, A. Debelle, J.B. Wallace, L.B. Bayu Aji, S.O. Kucheyev

    The amorphization of 3C-SiC irradiated at moderately elevated temperatures as revealed by X-ray diffraction

    Acta Materialia 140, 250–257 · doi:10.1016/j.actamat.2017.08.030

2016

  1. A. Boulle, I.C. Infante, N. Lemée

    Diffuse X-ray scattering from 180° ferroelectric stripe domains: Polarization-induced strain, period disorder and wall roughness

    Journal of Applied Crystallography 49, 845–855 · doi:10.1107/S1600576716005331

  2. F. Jean, L. Huitema, A. Ghalem, M. Rammal, A. Boulle, F. Rémondière, J.-C. Orlianges, S. Députier, A. Crunteanu, D. Passerieux, M. Chatras, M. Guilloux- Viry, J.-R. Duclère

    Microwave dielectric properties of pure and Mn-doped lead-free Na0.5Bi0.5TiO3 epitaxial thin films grown on (001) LaAlO3 single crystals using pulsed laser deposition

    Physica Status Solidi A 213, 3221–3230 · doi:10.1002/pssa.201600209

  3. M. Souilah, A. Boulle, A. Debelle

    RaDMaX: A graphical program for the determination of strain and damage profiles in irradiated crystals

    Journal of Applied Crystallography 49, 311–316 · doi:10.1107/S1600576715021019

  4. V. Théry, A. Boulle, A. Crunteanu, J.C. Orlianges, A. Beaumont, R. Mayet, A. Mennai, F. Cosset, A. Bessaudou, M. Fabert

    Role of thermal strain in the metal-insulator and structural phase transition of epitaxial VO2 films

    Physical Review B 93, Art. 184106 · doi:10.1103/PhysRevB.93.184106

  5. B. Tyburska-Püschel, Y. Zhai, L. He, C. Liu, A. Boulle, P.M. Voyles, I. Szlufarska, K. Sridharan

    Size distribution of black spot defects and their contribution to swelling in irradiated SiC

    Journal of Nuclear Materials 476, 132–139 · doi:10.1016/j.jnucmat.2016.04.044

  6. A. Boulle, A. Debelle

    Statistical Nature of Atomic Disorder in Irradiated Crystals

    Physical Review Letters 116, Art. 245501 · doi:10.1103/PhysRevLett.116.245501

  7. H. Palancher, P. Goudeau, A. Boulle, F. Rieutord, V. Favre-Nicolin, N. Blanc, G. Martin, J. Fouet, C. Onofri

    Strain profiles in ion implanted ceramic polycrystals: An approach based on reciprocal-space crystal selection

    Applied Physics Letters 108, Art. 31903 · doi:10.1063/1.4939972

  8. H. Palancher, R. Kachnaoui, G. Martin, A. Richard, J.-C. Richaud, C. Onofri, R. Belin, A. Boulle, H. Rouquette, C. Sabathier, G. Carlot, P. Desgardin, T. Sauvage, F. Rieutord, J. Raynal, Goudeau Ph., A. Ambard

    Strain relaxation in He implanted UO2 polycrystals under thermal treatment: An in situ XRD study

    Journal of Nuclear Materials 476, 63–76 · doi:10.1016/j.jnucmat.2016.04.023

2015

  1. Y. Zhang, A. Debelle, A. Boulle, P. Kluth, F. Tuomisto

    Advanced techniques for characterization of ion beam modified materials

    Current Opinion in Solid State and Materials Science 19, 19–28 · doi:10.1016/j.cossms.2014.09.007

  2. N. Mejai, A. Debelle, L. Thomé, G. Sattonnay, D. Gosset, A. Boulle, R. Dargis, A. Clark

    Depth-dependent phase change in Gd2O3 epitaxial layers under ion irradiation

    Applied Physics Letters 107, Art. 131903 · doi:10.1063/1.4932089

  3. J. Channagiri, A. Boulle, A. Debelle

    Diffuse X-ray scattering from ion-irradiated materials: A parallel-computing approach

    Journal of Applied Crystallography 48, 252–261 · doi:10.1107/S1600576715000631

  4. T.-H. Nguyen, A. Debelle, A. Boulle, F. Garrido, L. Thomé, V. Demange

    Mechanical response of UO2 single crystals submitted to low-energy ion irradiation

    Journal of Nuclear Materials 467, 505–511 · doi:10.1016/j.jnucmat.2015.10.046

  5. N. Lemée, I.C. Infante, C. Hubault, A. Boulle, N. Blanc, N. Boudet, V. Demange, M.G. Karkut

    Polarization rotation in ferroelectric tricolor PbTiO3/SrTiO3/PbZr0.2Ti0.8O3 superlattices

    ACS Applied Materials and Interfaces 7, 19906–19913 · doi:10.1021/acsami.5b03456

  6. M. Garel, D. Babonneau, A. Boulle, F. Pailloux, A. Coati, Y. Garreau, A.Y. Ramos, H.C.N. Tolentino

    Self-organized ultrathin FePt nanowires produced by glancing-angle ion-beam codeposition on rippled alumina surfaces

    Nanoscale 7, 1437–1445 · doi:10.1039/c4nr05589f

2014

  1. A. Debelle, J. Channagiri, L. Thomé, B. Décamps, A. Boulle, S. Moll, F. Garrido, M. Behar, J. Jagielski

    Comprehensive study of the effect of the irradiation temperature on the behavior of cubic zirconia

    Journal of Applied Physics 115, Art. 183504 · doi:10.1063/1.4874795

  2. J. Channagiri, A. Boulle, A. Debelle

    Determination of strain and damage profiles in irradiated materials: Application to cubic zirconia irradiated at high temperature

    Nuclear Instruments and Methods in Physics Research B 327, 9–14 · doi:10.1016/j.nimb.2013.10.086

  3. X. Li, H. Jacobson, A. Boulle, D. Chaussende, A. Henry

    Double-position-boundaries free 3C-SiC epitaxial layers grown on on-axis 4H-SiC

    ECS Journal of Solid State Science and Technology 3, P75–P81 · doi:10.1149/2.012404jss

  4. G. Velişa, A. Debelle, L. Thomé, S. Mylonas, L. Vincent, A. Boulle, J. Jagielski, D. Pantelica

    Implantation of high concentration noble gases in cubic zirconia and silicon carbide: A contrasted radiation tolerance

    Journal of Nuclear Materials 451, 14–23 · doi:10.1016/j.jnucmat.2014.03.019

  5. A. Debelle, A. Boulle, A. Chartier, F. Gao, W.J. Weber

    Interplay between atomic disorder, lattice swelling, and defect energy in ion-irradiation-induced amorphization of SiC

    Physical Review B 90, Art. 174112 · doi:10.1103/PhysRevB.90.174112

  6. M. Bousquet, L. Batista, J.L. Dellis, A. Boulle, U. Rabe, O. Durand-Drouhin, Y. Gagou, L. Dupont, V. Viallet, A. Zeinert, S. Hirsekorn, N. Lemée

    Structural and electrical properties of Bi0.5Na0.5 TiO3 based superlattices grown by pulsed laser deposition

    Journal of Applied Physics 116, Art. 194104 · doi:10.1063/1.4901931

  7. D. Carbone, A.I. Pateras, G. Bussone, P.G. Evans, T.W. Cornelius, M. Bousquet, A. Boulle, B. Gautier, J.R. Duclère

    Structural observation of piezoelectric inhomogeneity in a mixed-orientation Na0.5Bi0.5TiO3 perovskite thin film

    Applied Physics Letters 105, Art. 242901 · doi:10.1063/1.4904458

2013

  1. A. Henry, X. Li, H. Jacobson, S. Andersson, A. Boulle, D. Chaussende, E. Janzén

    3C-SiC heteroepitaxy on hexagonal SiC substrates

    Materials Science Forum 740-742, 257–262 · doi:10.4028/www.scientific.net/MSF.740-742.257

  2. A. Debelle, A. Boulle, F. Rakotovao, J. Moeyaert, C. Bachelet, F. Garrido, L. Thomé

    Influence of elastic properties on the strain induced by ion irradiation in crystalline materials

    Journal of Physics D: Applied Physics 46, Art. 45309 · doi:10.1088/0022-3727/46/4/045309

  3. A. Boulle, D. Dompoint, I. Galben-Sandulache, D. Chaussende

    Polytypic transformations in SiC: Diffuse x-ray scattering and Monte Carlo simulations

    Physical Review B 88, Art. 24103 · doi:10.1103/PhysRevB.88.024103

  4. F. Jean, J.-R. Duclère, F. Rémondière, A. Boulle, S. Députier, V. Coudert, M. Guilloux-Viry

    Randomly organized and self-assembled Na0.5Bi 0.5TiO3 nanodots elaborated by sol-gel and pulsed laser deposition routes

    Materials Letters 107, 299–302 · doi:10.1016/j.matlet.2013.06.021

  5. A. Boulle, F. Conchon, R. Guinebretiére

    The Micro- and Nanostructure of Imperfect Oxide Epitaxial Films

    Modern Diffraction Methods, 259–282 · doi:10.1002/9783527649884.ch9

2012

  1. A. Debelle, M. Backman, L. Thomé, W.J. Weber, M. Toulemonde, S. Mylonas, A. Boulle, O.H. Pakarinen, N. Juslin, F. Djurabekova, K. Nordlund, F. Garrido, D. Chaussende

    Combined experimental and computational study of the recrystallization process induced by electronic interactions of swift heavy ions with silicon carbide crystals

    Physical Review B 86, Art. 100102 · doi:10.1103/PhysRevB.86.100102

  2. D. Dompoint, A. Boulle, I.G. Galben-Sandulache, D. Chaussende

    Diffuse X-ray scattering from partially transformed 3C-SiC single crystals

    Nuclear Instruments and Methods in Physics Research B 284, 19–22 · doi:10.1016/j.nimb.2011.09.008

  3. M. Bousquet, J.-R. Duclère, B. Gautier, A. Boulle, A. Wu, S. Députier, D. Fasquelle, F. Rémondière, D. Albertini, C. Champeaux, P. Marchet, M. Guilloux-Viry, P. Vilarinho

    Electrical properties of (110) epitaxial lead-free ferroelectric Na 0.5Bi 0.5TiO 3 thin films grown by pulsed laser deposition: Macroscopic and nanoscale data

    Journal of Applied Physics 111, Art. 104106 · doi:10.1063/1.4716177

  4. F. Jean, M. Bousquet, J.-R. Duclère, A. Boulle, F. Rémondière, S. Députier, J.-C. Orlianges, P. Marchet, M. Guilloux-Viry

    Epitaxial growth and properties of lead-free ferroelectric Na 0.5Bi 0.5TiO 3 thin films grown by pulsed laser deposition on various single crystal substrates

    Proc. IEEE ISAF/ECAPD/PFM 2012, Art. 6297851 · doi:10.1109/ISAF.2012.6297851

  5. N. Chaâbane, A. Debelle, G. Sattonnay, P. Trocellier, Y. Serruys, L. Thomé, Y. Zhang, W.J. Weber, C. Meis, L. Gosmain, A. Boulle

    Investigation of irradiation effects induced by self-ion in 6H-SiC combining RBS/C, Raman and XRD

    Nuclear Instruments and Methods in Physics Research B 286, 108–113 · doi:10.1016/j.nimb.2011.11.018

  6. T. Petrisor, M.S. Gabor, C. Tiusan, V. Galluzzi, G. Celentano, S. Popa, A. Boulle, T. Petrisor

    Magnetic pinning effects of epitaxial La xSr 1-xMnO 3 nanostructured thin films on YBa 2Cu 3O 7-δ layers

    Journal of Applied Physics 112, Art. 53919 · doi:10.1063/1.4748049

  7. D. Dompoint, I.G. Galben-Sandulache, A. Boulle, D. Chaussende, D. Eyidi, J.-L. Demenet, M.-F. Beaufort, J. Rabier

    On the stability of 3C-SiC single crystals at high temperatures

    Materials Science Forum 717-720, 493–496 · doi:10.4028/www.scientific.net/MSF.717-720.493

  8. A. Debelle, L. Thomé, A. Boulle, S. Moll, F. Garrido, L. Qasim, P. Rosza

    Response of cubic zirconia irradiated with 4-MeV Au ions at high temperature: An X-ray diffraction study

    Nuclear Instruments and Methods in Physics Research B 277, 14–17 · doi:10.1016/j.nimb.2011.12.047

  9. C. Hubault, C. Davoisne, A. Boulle, L. Dupont, V. Demange, A. Perrin, B. Gautier, J. Holc, M. Kosec, M.G. Karkut, N. Lemée

    Strain effect in PbTiO3/PbZr0.2Ti0.8O 3 superlattices: From polydomain to monodomain structures

    Journal of Applied Physics 112, Art. 114102 · doi:10.1063/1.4767329

2011

  1. C. Hubault, C. Davoisne, L. Dupont, A. Perrin, A. Boulle, J. Holc, M. Kosec, M.G. Karkut, N. Lemée

    Inhibition of polydomain formation in PbTiO3/PbZr 0.2Ti0.8O3 superlattices by intercalation of ultra-thin SrTiO3 layers

    Applied Physics Letters 99, Art. 52905 · doi:10.1063/1.3619843

  2. D. Dompoint, A. Boulle, I. Galben-Sandulache, D. Chaussende, L.T.M. Hoa, T. Ouisse, D. Eyidi, J.L. Demenet, M.F. Beaufort, J. Rabier

    Kinetics of the 3C-6H polytypic transition in 3C-SiC single crystals: A diffuse X-ray scattering study

    Journal of Applied Physics 110, Art. 53508 · doi:10.1063/1.3627371

  3. N. Jegenyes, G. Manolis, J. Lorenzzi, V. Soulière, D. Dompoint, A. Boulle, G. Ferro, K. Jarašiunas

    Nondestructive evaluation of photo-electrical properties of 3C-SiC (111) homoepitaxial layers grown by CVD

    Materials Science Forum 679-680, 153–156 · doi:10.4028/www.scientific.net/MSF.679-680.153

  4. T. Petrisor, M.S. Gabor, A. Boulle, C. Bellouard, C. Tiusan, O. Pana, T. Petrisor

    Oxygen incorporation effects in annealed epitaxial La (1-x)SrxMnO3 thin films

    Journal of Applied Physics 109, Art. 123913 · doi:10.1063/1.3596807

  5. A. Debelle, A. Boulle, F. Garrido, L. Thomé

    Strain and stress build-up in He-implanted UO2 single crystals: An X-ray diffraction study

    Journal of Materials Science 46, 4683–4689 · doi:10.1007/s10853-011-5375-1

  6. A. Létoublon, W. Guo, C. Cornet, A. Boulle, M. Véron, A. Bondi, O. Durand, T. Rohel, O. Dehaese, N. Chevalier, N. Bertru, A. Le Corre

    X-ray study of antiphase domains and their stability in MBE grown GaP on Si

    Journal of Crystal Growth 323, 409–412 · doi:10.1016/j.jcrysgro.2010.10.137

2010

  1. W. Hamd, A. Boulle, E. Thune, R. Guinebretiere

    A new way to prepare tin oxide precursor polymeric gels

    Journal of Sol-Gel Science and Technology 55, 15–18 · doi:10.1007/s10971-010-2206-9

  2. A. Debelle, L. Thomé, D. Dompoint, A. Boulle, F. Garrido, J. Jagielski, D. Chaussende

    Characterization and modelling of the ion-irradiation induced disorder in 6H-SiC and 3C-SiC single crystals

    Journal of Physics D: Applied Physics 43, Art. 455408 · doi:10.1088/0022-3727/43/45/455408

  3. A. Boulle, D. Dompoint, I. Galben-Sandulache, D. Chaussende

    Defects and polytypism in SiC: The role of diffuse X-ray scattering

    AIP Conference Proceedings 1292, 43–46 · doi:10.1063/1.3518307

  4. M. Bousquet, J.-R. Ducl̀re, C. Champeaux, A. Boulle, P. Marchet, A. Catherinot, A. Wu, P.M. Vilarinho, S. D́putier, M. Guilloux-Viry, A. Crunteanu, B. Gautier, D. Albertini, C. Bachelet

    Macroscopic and nanoscale electrical properties of pulsed laser deposited (100) epitaxial lead-free Na0.5Bi0.5TiO3 thin films

    Journal of Applied Physics 107, Art. 34102 · doi:10.1063/1.3290956

  5. M. Bousquet, J.-R. Ducl̀re, E. Orhan, A. Boulle, C. Bachelet, C. Champeaux

    Optical properties of an epitaxial Na0.5Bi0.5TiO 3 thin film grown by laser ablation: Experimental approach and density functional theory calculations

    Journal of Applied Physics 107, Art. 104107 · doi:10.1063/1.3400095

  6. S. Kilburger, E. Millon, P. Di Bin, A. Boulle, R. Guinebretière, C. Di Bin

    Properties of LiNbO3 based heterostructures grown by pulsed-laser deposition for optical waveguiding application

    Thin Solid Films 518, 4654–4657 · doi:10.1016/j.tsf.2009.12.052

  7. A. Boulle, D. Dompoint, I. Galben-Sandulache, D. Chaussende

    Quantitative analysis of diffuse X-ray scattering in partially transformed 3C-SiC single crystals

    Journal of Applied Crystallography 43, 867–875 · doi:10.1107/S0021889810019412

  8. A. Boulle, A. Debelle

    Strain-profile determination in ion-implanted single crystals using generalized simulated annealing

    Journal of Applied Crystallography 43, 1046–1052 · doi:10.1107/S0021889810030281

  9. D. Dompoint, A. Boulle, I.G. Galben-Sandulache, D. Chaussende

    Study of the stability of 3C-SiC single crystals using high-resolution diffuse X-ray scattering

    AIP Conference Proceedings 1292, 71–74 · doi:10.1063/1.3518314

2009

  1. W. Hamd, Y.C. Wu, A. Boulle, E. Thune, R. Guinebretière

    Microstructural study of SnO2 thin layers deposited on sapphire by sol-gel dip-coating

    Thin Solid Films 518, 1–5 · doi:10.1016/j.tsf.2009.05.053

  2. E. Thune, A. Boulle, D. Babonneau, F. Pailloux, W. Hamd, R. Guinebretière

    Nanostructured sapphire vicinal surfaces as templates for the growth of self-organized oxide nanostructures

    Applied Surface Science 256, 924–928 · doi:10.1016/j.apsusc.2009.08.089

  3. A. Boulle, S. Kilburger, P. Di Bin, E. Millon, C. Di Bin, R. Guinebretière, A. Bessaudou

    Role of nanostructure on the optical waveguiding properties of epitaxial LiNbO3 films

    Journal of Physics D: Applied Physics 42, Art. 145403 · doi:10.1088/0022-3727/42/14/145403

  4. A. Boulle, F. Conchon, R. Guinebretière

    Strain profiles in thin films: Influence of a coherently diffracting substrate and thickness fluctuations

    Journal of Applied Crystallography 42, 85–92 · doi:10.1107/S0021889808036406

  5. Y.C. Wu, W. Hamd, E. Thune, A. Boulle, C. Rochas, R. Guinebretière

    Synthesis of tin oxide nanosized crystals embedded in silica matrix through sol-gel process using alkoxide precursors

    Journal of Non-Crystalline Solids 355, 951–959 · doi:10.1016/j.jnoncrysol.2009.04.033

  6. A. Boulle, J. Aube, I.G. Galben-Sandulache, D. Chaussende

    The 3C-6H polytypic transition in SiC as revealed by diffuse x-ray scattering

    Applied Physics Letters 94, Art. 201904 · doi:10.1063/1.3141509

2008

  1. A. Boulle, D. Chaussende, F. Conchon, G. Ferro, O. Masson

    Characterization of stacking faults in thick 3C-SiC crystals using high-resolution diffuse X-ray scattering

    Journal of Crystal Growth 310, 982–987 · doi:10.1016/j.jcrysgro.2007.11.149

  2. F. Conchon, A. Boulle, R. Guinebretière, E. Dooryhée, J.-L. Hodeau, C. Girardot, S. Pignard, J. Kreisel, F. Weiss, L. Libralesso, T.L. Lee

    Investigation of strain relaxation mechanisms and transport properties in epitaxial SmNiO3 films

    Journal of Applied Physics 103, Art. 123501 · doi:10.1063/1.2938845

  3. J.-R. Duclère, C. Cibert, A. Boulle, V. Dorcet, P. Marchet, C. Champeaux, A. Catherinot, S. Députier, M. Guilloux-Viry

    Lead-free Na0.5Bi0.5TiO3 ferroelectric thin films grown by Pulsed Laser Deposition on epitaxial platinum bottom electrodes

    Thin Solid Films 517, 592–597 · doi:10.1016/j.tsf.2008.06.088

  4. D. Chaussende, F. Mercier, A. Boulle, F. Conchon, M. Soueidan, G. Ferro, A. Mantzari, A. Andreadou, E.K. Polychroniadis, C. Balloud, S. Juillaguet, J. Camassel, M. Pons

    Prospects for 3C-SiC bulk crystal growth

    Journal of Crystal Growth 310, 976–981 · doi:10.1016/j.jcrysgro.2007.11.140

  5. F. Conchon, A. Boulle, R. Guinebretière, E. Dooryhée, J.-L. Hodeau, C. Girardot, S. Pignard, J. Kreisel, F. Weiss

    The role of strain-induced structural changes in the metal-insulator transition in epitaxial SmNiO3 films

    Journal of Physics: Condensed Matter 20, Art. 145216 · doi:10.1088/0953-8984/20/14/145216

2007

  1. C. Restoin, J.-L. Auguste, G. Brasse, S. Hautreux, S. Février, J.-M. Blondy, A. Boulle, A. Lecomte

    Advances in original fibres fabrication using innovative techniques

    Optical and Quantum Electronics 39, 1033–1045 · doi:10.1007/s11082-007-9157-6

  2. A. Boulle, D. Chaussende, F. Pecqueux, F. Conchon, L. Latu-Romain, O. Masson

    Determination of stacking fault densities in 3C-SiC crystals by diffuse X-ray scattering

    Physica Status Solidi A 204, 2528–2534 · doi:10.1002/pssa.200675652

  3. F. Conchon, A. Boulle, R. Guinebretìre, C. Girardot, S. Pignard, J. Kreisel, F. Weiss, E. Dooryh́e, J.-L. Hodeau

    Effect of tensile and compressive strains on the transport properties of SmNiO3 layers epitaxially grown on (001) SrTiO3 and LaAlO3 substrates

    Applied Physics Letters 91, Art. 192110 · doi:10.1063/1.2800306

  4. F. Conchon, A. Boulle, C. Girardot, S. Pignard, R. Guinebretière, E. Dooryhée, J.-L. Hodeau, F. Weiss, J. Kreisel, J.-F. Bérar

    Epitaxial stabilization of SmNiO3 films on (0 0 1) SrTiO 3 substrates

    Journal of Physics D: Applied Physics 40, 4872–4876 · doi:10.1088/0022-3727/40/16/017

  5. S. Kilburger, R. Chety, E. Millon, Di Bin Ph., C. Di Bin, A. Boulle, R. Guinebretière

    Growth of LiNbO 3 thin films on sapphire by pulsed-laser deposition for electro-optic modulators

    Applied Surface Science 253, 8263–8267 · doi:10.1016/j.apsusc.2007.02.112

  6. R. Guinebretière, A. Boulle, R. Bachelet, O. Masson, P. Thomas

    High-temperature (1500 K) reciprocal space mapping on a laboratory X-ray diffractometer

    Journal of Applied Crystallography 40, 332–337 · doi:10.1107/S0021889807003433

  7. F. Conchon, A. Boulle, C. Girardot, S. Pignard, R. Guinebretière, E. Dooryhée, J.-L. Hodeau, F. Weiss, J. Kreisel

    Influence of strain relaxation on the structural stabilization of SmNiO3 films epitaxially grown on (0 0 1) SrTiO3 substrates

    Materials Science and Engineering: B 144, 32–37 · doi:10.1016/j.mseb.2007.07.096

  8. C. Girardot, F. Conchon, A. Boulle, P. Chaudouet, N. Caillault, J. Kreisel, R. Guinebretière, F. Weiss, S. Pignard

    Influence of thickness on the epitaxial stabilisation of SmNiO3 thin films

    Surface and Coatings Technology 201, 9021–9024 · doi:10.1016/j.surfcoat.2007.04.123

  9. P. Lenormand, A. Lecomte, C. Laberty-Robert, F. Ansart, A. Boulle

    Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±δ thin films prepared by a dip-coating process

    Journal of Materials Science 42, 4581–4590 · doi:10.1007/s10853-006-0560-3

  10. F. Conchon, A. Boulle, R. Guinebretière

    Misfit dislocations in highly mismatched oxide interfaces, an X-ray diffraction study

    Physica Status Solidi A 204, 2535–2541 · doi:10.1002/pssa.200675653

  11. R. Bachelet, S. Cottrino, G. Nahélou, V. Coudert, A. Boulle, B. Soulestin, F. Rossignol, R. Guinebretière, A. Dauger

    Self-patterned oxide nanostructures grown by post-deposition thermal annealing on stepped surfaces

    Nanotechnology 18, Art. 15301 · doi:10.1088/0957-4484/18/1/015301

  12. R. Bachelet, A. Boulle, B. Soulestin, F. Rossignol, R. Guinebretière, A. Dauger

    Two-dimensional versus three-dimensional post-deposition grain growth in epitaxial oxide thin films. Influence of the substrate surface roughness

    Thin Solid Films 515, 7080–7085 · doi:10.1016/j.tsf.2007.02.099

2006

  1. A. Gaudon, F. Lallet, A. Boulle, A. Lecomte, B. Soulestin, R. Guinebretière, A. Dauger

    From amorphous phase separations to nanostructured materials in sol-gel derived ZrO2:Eu3+/SiO2 and ZnO/SiO2 composites

    Journal of Non-Crystalline Solids 352, 2152–2158 · doi:10.1016/j.jnoncrysol.2006.02.054

  2. N. Olivi-Tran, A. Boulle, A. Gaudon, A. Dauger

    Morphological instabilities of a thin film on a Penrose lattice: A Monte Carlo study

    Physics Letters A 351, 426–430 · doi:10.1016/j.physleta.2005.11.023

  3. A. Boulle, R. Guinebretière, O. Masson, R. Bachelet, F. Conchon, A. Dauger

    Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire

    Applied Surface Science 253, 95–105 · doi:10.1016/j.apsusc.2006.05.086

  4. A. Boulle, F. Conchon, R. Guinebretière

    Reciprocal-space mapping of epitaxic thin films with crystallite size and shape polydispersity

    Acta Crystallographica A 62, 11–20 · doi:10.1107/S0108767305037657

  5. A. Boulle, R. Guinebretière, A. Dauger

    X-ray diffraction from epitaxial thin films: An analytical expression of the line profiles accounting for microstructure

    Zeitschrift für Kristallographie 221, 123–128 · doi:10.1524/9783486992526-023

  6. A. Boulle, R. Guinebretière, A. Dauger

    X-ray diffraction from epitaxial thin films: An analytical expression of the line profiles accounting for microstructure

    Zeitschrift für Kristallographie, Supplement 1, 123–128 · doi:10.1524/zksu.2006.suppl_23.123

  7. A. Boulle, D. Chaussende, L. Latu-Romain, F. Conchon, O. Masson, R. Guinebretière

    X-ray diffuse scattering from stacking faults in thick 3C-SiC single crystals

    Applied Physics Letters 89, Art. 91902 · doi:10.1063/1.2338787

  8. R. Guinebretière, A. Boulle, O. Masson, A. Dauger

    X-ray scattering from interface dislocations in highly mismatched oxide epitaxial films

    Zeitschrift für Kristallographie, Supplement 2, 263–268 · doi:10.1524/zksu.2006.suppl_23.263

2005

  1. R. Bachelet, G. Nahélou, A. Boulle, R. Guinebretière, A. Dauger

    Control of the morphology of oxide nano-islands through the substrate miscut angle

    Progress in Solid State Chemistry 33, 327–332 · doi:10.1016/j.progsolidstchem.2005.11.017

  2. A. Boulle, R. Guinebretìre, A. Dauger

    Highly localized strain fields due to planar defects in epitaxial SrBi2 Nb2 O9 thin films

    Journal of Applied Physics 97, Art. 73503 · doi:10.1063/1.1870119

  3. R. Guinebretìre, A. Boulle, O. Masson, A. Dauger

    Instrumental aspects in X-ray diffraction on polycrystalline materials

    Powder Diffraction 20, 294–305 · doi:10.1154/1.2136890

  4. O. Masson, A. Boulle, R. Guinebretìre, A. Lecomte, A. Dauger

    On the use of one-dimensional position sensitive detector for x-ray diffraction reciprocal space mapping: Data quality and limitations

    Review of Scientific Instruments 76, Art. 63912 · doi:10.1063/1.1938850

  5. A. Boulle, R. Guinebretière, A. Dauger

    Phenomenological analysis of heterogeneous strain fields in epitaxial thin films using x-ray scattering

    Journal of Physics D: Applied Physics 38, 3907–3920 · doi:10.1088/0022-3727/38/21/012

2004

  1. A. Boulle, R. Guinebretière, A. Dauger

    Étude de la microstructure de couches minces par diffraction des rayons X: Description analytique des profils de raie

    Journal de Physique IV 118, 183–191 · doi:10.1051/jp4:2004118022

  2. R. Guinebretière, R. Bachelet, A. Boulle, O. Masson, A. Lecomte, A. Dauger

    Growth and relaxation of (Zr,Y)O2 epitaxial layers analyzed by XRD reciprocal space mapping

    Materials Science and Engineering: B 109, 42–46 · doi:10.1016/j.mseb.2003.10.082

  3. A. Boulle, O. Masson, R. Guinebretière, A. Dauger

    Strain profiles in yttria stabilized zirconia epitaxial thin films determined by high-resolution X-ray diffraction

    Thin Solid Films 450, 66–70 · doi:10.1016/j.tsf.2003.10.075

2003

  1. A. Boulle, O. Masson, R. Guinebretière, A. Dauger

    A new method for the determination of strain profiles in epitaxic thin films using X-ray diffraction

    Journal of Applied Crystallography 36, 1424–1431 · doi:10.1107/S0021889803020351

  2. A. Boulle, L. Canale, R. Guinebretière, C. Girault-Di Bin, A. Dauger

    Defect structure of pulsed laser deposited LiNbO3/Al2O3 layers determined by X-ray diffraction reciprocal space mapping

    Thin Solid Films 429, 55–62 · doi:10.1016/S0040-6090(03)00030-0

  3. S. Liebus, A. Boulle, F. Cosset, C.G.-D. Bin, R. Guinebretière, A. Bessaudou, J.C. Vareille

    Microstructural and microwave characterizations of pulsed laser ablated barium and strontium titanate thin films

    Ferroelectrics 288, 49–57 · doi:10.1080/00150190390212034

  4. A. Boulle, C. Restoin, C. Darraud-Taupiac, R. Guinebretière, A. Dauger

    Structural characterization using X-ray diffraction of Ti indiffused periodically poled LiNbO3 fabricated by direct electron beam bombardment

    Ferroelectrics, Letters Section 30, 91–98 · doi:10.1080/07315170390274605

  5. A. Boulle, O. Masson, R. Guinebretière, A. Dauger

    X-Ray diffraction from epitaxial oxide layers grown from sol-gel

    Thin Solid Films 434, 1–6 · doi:10.1016/S0040-6090(02)00721-6

2002

  1. A. Boulle, O. Masson, R. Guinebretière, A. Lecomte, A. Dauger

    A high-resolution X-ray diffractometer for the study of imperfect materials

    Journal of Applied Crystallography 35, 606–614 · doi:10.1107/S0021889802011470

  2. R. Guinebretière, A. Boulle, O. Masson, A. Dauger

    Cartographie du réseau réciproque sur couches d'oxydes épitaxiées à l'aide d'un montage équipé d'un détecteur courbe à localisation

    Journal de Physique IV 12, Pr6–273 · doi:10.1051/jp4:20020236

  3. A. Boulle, L. Pradier, O. Masson, R. Guinebretière, A. Dauger

    Microstructural analysis in epitaxial zirconia layers

    Applied Surface Science 188, 80–84 · doi:10.1016/S0169-4332(01)00710-3

  4. A. Boulle, C. Legrand, R. Guinebretlère, J.P. Mercuric, A. Dauger

    Planar faults in aurivillius compounds: An X-ray diffraction study

    Philosophical Magazine A 82, 615–632 · doi:10.1080/01418610208239621

2001

  1. A. Boulle, Z. Oudjedi, R. Guinebretière, B. Soulestin, A. Dauger

    Ceramic nanocomposites obtained by sol-gel coating of submicron powders

    Acta Materialia 49, 811–816 · doi:10.1016/S1359-6454(00)00366-9

  2. A. Boulle, O. Masson, R. Guinebretière, A. Dauger

    Miscut angles measurement and precise sample positioning with a four circle diffractometer

    Applied Surface Science 180, 322–327 · doi:10.1016/S0169-4332(01)00369-5

  3. A. Boulle, C. Legrand, R. Guinebretière, J.P. Mercurio, A. Dauger

    Planar faults in layered Bi-containing perovskites studied by x-ray diffraction line profile analysis

    Journal of Applied Crystallography 34, 699–703 · doi:10.1107/S0021889801011700

  4. A. Boulle, C. Legrand, P. Thomas, R. Guinebretière, J.P. Mercurio, A. Dauger

    Stacking disorder in Aurivillius compounds studied by X-ray diffraction line profile analysis

    Materials Science Forum 378-381, 753–758 · doi:10.4028/www.scientific.net/msf.378-381.753

  5. A. Boulle, C. Legrand, R. Guinebretière, J.P. Mercurio, A. Dauger

    X-Ray diffraction line broadening by stacking faults in SrBi2Nb2O9/SrTiO3 epitaxial thin films

    Thin Solid Films 391, 42–46 · doi:10.1016/S0040-6090(01)00975-0